Optical inspection hmanrua hian scientific research, industrial production leh quality control-ah hmun pawimawh tak a chang a ni. Optical principle leh technology hmangin substance te an zirchiang a, an teh a, an hmuchhuak bawk. A hnuaia tarlan te hi optical inspection hmanrua hman tlanglawn tak tak leh an hman dan tur te an ni:
Spectral thlirletna .
1. Spectrophotometer: Thil awmdan hmanga light absorption characteristics atanga chhut chuan qualitative leh quantitative analysis an nei a, chu chu chemical analysis, environment monitoring leh field dangteah an hmang nasa hle.
2. Ultraviolet spectrophotometer: Ultraviolet biala thil awmte thlirletna lam a ngaihtuah a, biology, damdawi leh field dang dangah pawh hman a ni fo.
3. Atomic Absorption Spectrometer: Test tur element-a ground state atomic vapor characteristic spectral lines absorption a zirchiang a, chu chu element quantitative analysis atan a tha hle.
4. Atomic Fluorescence Spectrometer: Frequency bik a radiation a lak hnua ground state atom atanga chhuak characteristic wavelength fluorescence a zirchiang a, chu chuan sensitivity leh selectivity sang tak a nei a ni.
5. Near-infrared spectrometer: Near-infrared spectral region-a radiation a teh a, chu chu ei leh in, agriculture leh field dang danga component analysis atan hman a ni.
6. Raman Spectrometer: Scientific research, criminal investigation leh jewelry identification leh field dangte atana hman tlâk material composition hriatfiah leh nemnghehna a zirchiang a.
Microscope hmanga siam a ni.
1. Optical Microscope: Thil te tak te microscopic images a enfiah a, biology, damdawi leh field dang dangah pawh hmanraw pawimawh tak a ni.
2. Electron microscope leh atomic force microscope: resolution sang zawk enfiah theihna a pe a, nano-scale materials characterization atan hman a ni.
High-Thil chiang taka tehna .
1. Laser interferometer: Laser wavelength hmanga siam niin, geometric quantities te chu a sei zawng leh a ang chi te dik takin a teh a, high-precision machine tools leh instruments te tan calibration leh detection artifact a ni.
2. Total Station: Angle tehna, hlat zawng tehna, leh san zawng danglamna tehna te a inzawm khawm a, topography, engineering, cadastral measurement leh field dang dangah te hman a ni nasa hle.
3. Distance Meter: Laser leh infrared technology hmangin hlat zawng chu rang tak leh dik takin a teh thin.
Optical detection hmanraw bik dangte .
1. EllipSometer: Film thickness leh optical constant ang chi parameters a teh a, semiconductor, optical coatings leh field dang dangah pawh hman a ni nasa hle.
2. Polarimeter: Thil pakhat optical rotation a teh a, chemistry, damdawi leh field dang danga material analysis atan hman a ni.
3. Colorimeter leh Colorimeter: Printing, textile leh industry dang danga color quality awm theihna turin color deviation teh rawh.
Technology lo chhuak tharte .
Technology siam chhuah a nih tak avangin optical inspection hmanrua thar tam tak a lo chhuak a, chu chu automatic optical inspection equipment (AOI) te a ni. Heng hmanrua te hian machine vision, artificial intelligence leh technology dangte chu a hmang khawm a, chu chuan electronic product, semiconductor leh thil siamchhuahna industry dangte automated inspection a nei thei a, production efficiency leh product quality a ti tha zawk a ni.
